Short-circuit and over-current fault detection for SiC MOSFET modules based on tunnel magnetoresistance with predictive capabilities / Yuxin Feng, Shuai Shao, Jiakun Du, Qian Chen, Junming Zhang, and Xinke Wu.
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TextPublication details: New York ; The Institute of Electrical and Electronics Engineers, Inc. , April 2022.Description: Volume 37, pages 3719-3723 : illustration ; 28 cmDDC classification: - DPer 621.381 In821 April 2022 v. 37 n. 4
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Periodicals
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UM Digos College - LIC | Periodicals | DPer 621.381 In821 April 2022 v. 37 n. 4 (Browse shelf(Opens below)) | Not for loan | Periodical Article |
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IEEE Transactions on Power Electronics, vol. 37, no. 4, pages 3719-3723, April 2022.
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