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Comparison and optimization of datasheet-driven extraction og gate-drain overlap oxide capacitance in igbt modeling /

Wu, Yuwei.

Comparison and optimization of datasheet-driven extraction og gate-drain overlap oxide capacitance in igbt modeling / Yuwei Wu, Laili Wang, Jianpeng Wang, Zenan Shi, and Jin Zhang. - New York ; The Institute of Electrical and Electronics Engineers, Inc., December 2022. - volume 37, pages 14023-14033, illustration.

IEEE Transactions on Power Electronics, v. 37 n. 12, pages 14023-14033, December 2022.


IGBT modeling.
Integrated circuit modeling.
Voltage.

DPer 621.317 Ie21part 1&2 December 2022 v.37 n. 12.