Comparisons of two turn-off failures under clamped inductive load in planar fs 3.3 kv/50 a igbt chip /
Fan, Jiayu.
Comparisons of two turn-off failures under clamped inductive load in planar fs 3.3 kv/50 a igbt chip / Jiayu Fan, Yaohua Wang, Feng He, Mingchao Gao, Zhibin Zhao, Xuebao Li, Xiang Cui, and Zhong Chen. - New York ; The Institute of Electrical and Electronics Engineers, Inc., December 2022. - volume 37, pages 14471-14481, illustration.
IEEE Transactions on Power Electronics, v. 37 n. 12, pages 14471-14481, December 2022.
Distinguished method.
dynamic latch-up.
secondary breakdown.
DPer 621.317 Ie21 December 2022 v.37 n. 12 part 1&2.
Comparisons of two turn-off failures under clamped inductive load in planar fs 3.3 kv/50 a igbt chip / Jiayu Fan, Yaohua Wang, Feng He, Mingchao Gao, Zhibin Zhao, Xuebao Li, Xiang Cui, and Zhong Chen. - New York ; The Institute of Electrical and Electronics Engineers, Inc., December 2022. - volume 37, pages 14471-14481, illustration.
IEEE Transactions on Power Electronics, v. 37 n. 12, pages 14471-14481, December 2022.
Distinguished method.
dynamic latch-up.
secondary breakdown.
DPer 621.317 Ie21 December 2022 v.37 n. 12 part 1&2.