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Measurement of circuit parasitics of SiC MOSFET in a half-bridge configuration /

Roy, Shamibrota Kishore.

Measurement of circuit parasitics of SiC MOSFET in a half-bridge configuration / Shamibrota Kishore Roy and Kaushik Basu. - New York ; The Institute of Electrical and Electronics Engineers, Inc. , October 2022. - Volume 37, pages 11911-11926 : illustration ; 28 cm.

IEEE Transactions on Power Electronics, v. 37, n. 10, pages 11911-11926, October 2022.

DPer 621.317 Ie21 October 2022 v. 37 n. 10