Online gate-oxide degradation monitoring of planar SiC MOSFETs based on gate charge time /
Xie, Minghang.
Online gate-oxide degradation monitoring of planar SiC MOSFETs based on gate charge time / Minghang Xie, Pengju Sun, Kaihong Wang, Quanming Luo, and Xiong Du. - New York ; The Institute of Electrical and Electronics Engineers, Inc. , June 2022. - Volume 37, pages 7333-7343 : illustration ; 29 cm.
IEEE Transactions on Power Electronics, vol. 37, no. 6, pages 7333-7343, June 2022.
DPer 621.317 Ie21 June 2022 v. 37 n. 6
Online gate-oxide degradation monitoring of planar SiC MOSFETs based on gate charge time / Minghang Xie, Pengju Sun, Kaihong Wang, Quanming Luo, and Xiong Du. - New York ; The Institute of Electrical and Electronics Engineers, Inc. , June 2022. - Volume 37, pages 7333-7343 : illustration ; 29 cm.
IEEE Transactions on Power Electronics, vol. 37, no. 6, pages 7333-7343, June 2022.
DPer 621.317 Ie21 June 2022 v. 37 n. 6