Analysis of energy loss in GaN e-mode devices under UIS stresses /
Sun, Ruize.
Analysis of energy loss in GaN e-mode devices under UIS stresses / Ruize Sun, Jingxue Lai, Chao Liu, Wanjun Chen, Yiqiang Chen, Zhaoji Li, and Bo Zhang. - New York ; The Institute of Electrical and Electronics Engineers, Inc. , June 2022. - Volume 37, pages 6711-6719 : illustration ; 29 cm.
IEEE Transactions on Power Electronics, vol. 37, no. 6, pages 6711-6719, June 2022.
DPer 621.317 Ie21 June 2022 v. 37 n. 6
Analysis of energy loss in GaN e-mode devices under UIS stresses / Ruize Sun, Jingxue Lai, Chao Liu, Wanjun Chen, Yiqiang Chen, Zhaoji Li, and Bo Zhang. - New York ; The Institute of Electrical and Electronics Engineers, Inc. , June 2022. - Volume 37, pages 6711-6719 : illustration ; 29 cm.
IEEE Transactions on Power Electronics, vol. 37, no. 6, pages 6711-6719, June 2022.
DPer 621.317 Ie21 June 2022 v. 37 n. 6